College:College of Arts and Sciences
Expertise:Acceleration-based Materials Analysis, Ion-Solid Interaction, Sputtering ("atomic-scale sandblasting")
Education:PhD, physics, California Institute of Technology BS, physics, University of Missouri-Columbia
Recent research focuses on depth profiling analysis of thin semiconductor films, using trace element accelerator mass spectrometry. Research focuses on using resonance ionization spectroscopy to study details of the sputtering of two component metal alloys.Member of the American Physical Society and Sigma Xi. Holds a bachelor's degree in physics from the University of Missouri at Columbia and a doctorate in physics from the California Institute of Technology.